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SEM/EDX analyses of some interactions between thick film resistors and dielectricsADIE, G; HOLODNIK, B; PITT, K et al.Microelectronics. 1984, Vol 15, Num 2, pp 38-43, issn 0026-2692Article

Thick film resistors on dielectrics as temperature detectorsRZASA, B; POTENCKI, J.Active and passive electronic components. 1986, Vol 12, Num 2, pp 137-147, issn 0882-7516Article

New thick-film strain gaugeABE, O; TAKETA, Y; HARADOME, M et al.Review of scientific instruments. 1988, Vol 59, Num 8, pp 1394-1398, issn 0034-6748, part 1Article

Liquid-phase sintering in thick-film resistor processingPONNUSAMY PALANISAMY; SARMA, D. H. R; VEST, R. W et al.Journal of the American Ceramic Society. 1985, Vol 68, Num 8, issn 0002-7820, C-215 -C-216Article

Performance of thick film strain gauges at cryogenic temperaturesFERRERO, C; MARINARI, C; MASOERO, A et al.Cryogenics (Guildford). 1990, Vol 30, Num 8, pp 726-729, issn 0011-2275Article

Material science of thick film technologyVEST, R. W.American Ceramic Society bulletin. 1986, Vol 65, Num 4, pp 631-636, issn 0002-7812Article

Robust process window for maintaining resistor balance during production printingELLIS, M. Ed.SPIE proceedings series. 2000, pp 772-777, isbn 0-930815-62-9Conference Paper

Effect of design parameters on overstress characterization of Thick film resistors for lightning surge protectionVASUDEVAN, S.SPIE proceedings series. 1997, pp 634-640, isbn 0-930815-50-5Conference Paper

Elastoresistance tensor components for thick-film resistorsAMIN, A.Applied physics letters. 1991, Vol 58, Num 13, pp 1446-1447, issn 0003-6951Article

Model for reliability prediction of thick film resistorsPRANCHOV, R. B; CAMPBELL, D. S.Electrocomponent science and technology. 1984, Vol 11, Num 2, pp 185-190, issn 0305-3091Article

EXCESS NOISE AND ITS TEMPERATURE DEPENDENCE IN THICK-FILM (CERMET) RESISTORSMASOERO A; RIETTO AM; MORTEN B et al.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 4; PP. 669-674; BIBL. 10 REF.Article

Effects of material parameters and processing conditions on high voltage sensitivity of polymer thick film resistorsSRINIVASA RAO, Y; SATYAM, M.Microelectronics international. 2002, Vol 19, Num 2, pp 6-7, issn 1356-5362, 8 p.Article

Experiences in obtaining cross belt uniformity of ±1°C in a 24 inch wide thick film conveyor furnaceDIMOCK, Fred.SPIE proceedings series. 2002, pp 860-863, isbn 0-930815-66-1, 4 p.Conference Paper

Simple and inexpensive cryogenic bolometersGALLINARO, G; GATTI, F; TERRENI, S et al.Cryogenics (Guildford). 1991, Vol 31, Num 1, pp 58-60, issn 0011-2275, 3 p.Article

Dickschichtwiderstände in Multilayerstrukturen = Résistances à couche épaisse avec structures multicouches = Thick film resistors with multilayer structuresTHOSS, D; REPPE, G.Nachrichtentechnik. Elektronik. 1984, Vol 34, Num 5, pp 168-171, issn 0323-4657Article

Electrical conduction and strain sensitivity in RuO₂ thick film resistorsCARCIA, P. F; SUNA, A; CHILDERS, W. D et al.Journal of applied physics. 1983, Vol 54, Num 10, pp 6002-6008, issn 0021-8979Article

Lead-free thick film resistors: an explorative investigationPRUDENZIATI, M; ZANARDI, F; MORTEN, B et al.Journal of materials science. Materials in electronics. 2002, Vol 13, Num 1, pp 31-37, issn 0957-4522Article

Highly reliable and lead (Pb) free thick film resistor paste system for low thermal expansion LTCC applicationFUKAYA, M; MATSUO, T; NISHIGAKI, S et al.SPIE proceedings series. 1997, pp 65-71, isbn 0-930815-50-5Conference Paper

About the impedance Cole-Cole diagrams of thick-film resistorsKUBOVY, A; STEFAN, O.Czechoslovak journal of physics. 1986, Vol 36, Num 5, pp 659-662, issn 0011-4626Article

Thick film temperature sensors using standard pastesJANOSKA, I; HASKARD, M. R.Active and passive electronic components. 1986, Vol 12, Num 2, pp 91-101, issn 0882-7516Article

Thick film chip resistors for use as low temperature thermometersLI, Q; WATSON, C. H; GOODRICH, R. G et al.Cryogenics (Guildford). 1986, Vol 26, Num 8, pp 467-470, issn 0011-2275Article

1/f^γ noise in thick-film resistors as an effect of tunnel and thermally activated emissions, from measures versus frequency and temperaturePELLEGRINI, B; SALETTI, R; TERRENI, P et al.Physical review. B, Condensed matter. 1983, Vol 27, Num 2, pp 1233-1243, issn 0163-1829Article

Thick-film resistor quality indicator based on noise index measurementsJEVTIC, M. M; MRAK, I; STANIMIROVIC, Z et al.Microelectronics journal. 1999, Vol 30, Num 12, pp 1255-1259, issn 0959-8324Article

Electrical properties of thick film resistors from noise measurementsPELED, A; KASAP, S. O; JOHANSON, R. E et al.Journal of materials science letters. 1997, Vol 16, Num 14, pp 1184-1186, issn 0261-8028Article